(Q33567823)

28 July 2017

title

Molecular depth profiling with cluster secondary ion mass spectrometry and wedges (English)

1 reference

28 July 2017

Nicholas Winograd

3

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author name string

Dan Mao

series ordinal

1

1 reference

28 July 2017

Andreas Wucher

series ordinal

2

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28 July 2017

language of work or name

English

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publication date

1 January 2010

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28 July 2017

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28 July 2017

volume

82

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28 July 2017

issue

1

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28 July 2017

page(s)

57-60

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Three-dimensional depth profiling of molecular structures.

28 July 2017

cites work

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2800856

Depth resolution during C60+ profiling of multilayer molecular films

21 June 2018

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2800856

Performance characteristics of a chemical imaging time-of-flight mass spectrometer

21 June 2018

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2800856

Quantitative molecular depth profiling of organic delta-layers by C60 ion sputtering and SIMS.

21 June 2018

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2800856

Molecular depth profiling with cluster ion beams.

31 October 2018

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2800856

Depth profiling of peptide films with TOF-SIMS and a C60 probe

31 October 2018

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2800856

Depth profiling of 4-acetamindophenol-doped poly(lactic acid) films using cluster secondary ion mass spectrometry

31 October 2018

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=2800856

Impact energy dependence of SF5+-induced damage in poly(methyl methacrylate) studied using time-of-flight secondary ion mass spectrometry

31 October 2018

1 reference

PubMed

https://pubmed.ncbi.nlm.nih.gov/19968247

inferred from PubMed ID database lookup

12 December 2020

based on heuristic

Identifiers

DOI

10.1021/AC902313Q

1 reference

28 July 2017

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28 July 2017

1 reference