(Q34332426)
Statements
1 reference
Two-photon excitation selective plane illumination microscopy (2PE-SPIM) of highly scattering samples: characterization and application (English)
1 reference
1 reference
Emiliano Ronzitti
1 reference
1 March 2013
1 reference
1 reference
21
1 reference
5
1 reference
5998-6008
1 reference
Identifiers
1 reference
1 reference