(Q37000858)

17 August 2017

title

Review of atom probe FIB-based specimen preparation methods (English)

1 reference

17 August 2017

Michael K Miller

1

1 reference

17 August 2017

Kaye F Russell

2

1 reference

17 August 2017

Keith Thompson

3

1 reference

17 August 2017

Roger Alvis

4

1 reference

17 August 2017

David J Larson

5

1 reference

17 August 2017

publication date

1 December 2007

1 reference

Microscopy and Microanalysis

17 August 2017

published in

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17 August 2017

volume

13

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17 August 2017

issue

6

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17 August 2017

page(s)

428-436

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Atom probe specimen preparation with a dual beam SEM/FIB miller

17 August 2017

cites work

1 reference

https://api.crossref.org/works/10.1017%2FS1431927607070845

Some aspects of atom probe specimen preparation and analysis of thin film materials.

21 January 2018

1 reference

https://api.crossref.org/works/10.1017%2FS1431927607070845

Atom probe specimen fabrication methods using a dual FIB/SEM

21 January 2018

1 reference

https://api.crossref.org/works/10.1017%2FS1431927607070845

Site-specific specimen preparation for atom probe tomography of grain boundaries

21 January 2018

1 reference

https://api.crossref.org/works/10.1017%2FS1431927607070845

In situ site-specific specimen preparation for atom probe tomography

21 January 2018

1 reference

https://api.crossref.org/works/10.1017%2FS1431927607070845

7 January 2021

Applications of the FIB lift-out technique for TEM specimen preparation

1 reference

https://api.crossref.org/works/10.1017%2FS1431927607070845

7 January 2021

Field-ion specimen preparation using focused ion-beam milling

1 reference

https://api.crossref.org/works/10.1017%2FS1431927607070845

7 January 2021

Strategies for fabricating atom probe specimens with a dual beam FIB

1 reference

https://api.crossref.org/works/10.1017%2FS1431927607070845

7 January 2021

10.1017/S1431927607070845

Identifiers

DOI

0 references

1 reference