Wikidata

(Q43275970)

English

Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams.

scientific article published in October 2009

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title
Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams (English)
1 reference
stated in
Europe PubMed Central
PubMed publication ID
19757450
reference URL
https://www.ebi.ac.uk/europepmc/webservices/rest/search?query=EXT_ID:19757450%20AND%20SRC:MED&resulttype=core&format=json
retrieved
7 February 2020
author

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