(Q46224811)
Statements
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Infrared imaging of the nanometer-thick accumulation layer in organic field-effect transistors (English)
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D N Basov
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Z Q Li
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G M Wang
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N Sai
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D Moses
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M C Martin
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M Di Ventra
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A J Heeger
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1 February 2006
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6
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2
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224-228
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Identifiers
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