(Q51530346)

English

X-ray wavefront characterization using a rotating shearing interferometer technique.

scientific article published in August 2011

In more languages
default for all languages
No label defined

No description defined

Statements

X-ray wavefront characterization using a rotating shearing interferometer technique. (English)
0 references

Identifiers

 
edit
    edit
      edit
        edit
          edit
            edit
              edit
                edit
                  edit