(Q52027507)
Statements
Fatigue resistance of ITI implant-abutment connectors -- a comparison of the standard cone with a novel internally keyed design. (English)
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John Botsis
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Jean Perriard
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W Anselm Wiskott
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Aissa Mellal
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Susanne S Scherrer
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Urs C Belser
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1 October 2002
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13
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5
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542-549
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Identifiers
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