(Q56429698)

English

Cryogenic scanning probe characterization of semiconductor nanostructures

No description defined

Statements

Cryogenic scanning probe characterization of semiconductor nanostructures (English)
0 references
0 references
M. A. Eriksson
0 references
R. G. Beck
0 references
M. Topinka
0 references
J. A. Katine
0 references
R. M. Westervelt
0 references
K. L. Campman
0 references
29 July 1996
0 references
69
0 references
5
0 references
671-673
0 references

Identifiers

 
edit
    edit
      edit
        edit
          edit
            edit
              edit
                edit
                  edit