(Q56483264)

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Characterization of a thickness‐shear mode quartz resonator with multiple nonpiezoelectric layers

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Characterization of a thickness‐shear mode quartz resonator with multiple nonpiezoelectric layers (English)

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author name string

Victoria Edwards Granstaff

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1

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Stephen J. Martin

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2

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publication date

February 1994

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published in

Journal of Applied Physics

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volume

75

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issue

3

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page(s)

1319-1329

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cites work

Improved quartz crystal microbalance technique

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https://api.crossref.org/works/10.1063%2F1.356410

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21 January 2018

Verwendung von Schwingquarzen zur Wägung dünner Schichten und zur Mikrowägung

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https://api.crossref.org/works/10.1063%2F1.356410

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21 January 2018

Characterization of a quartz crystal microbalance with simultaneous mass and liquid loading

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https://api.crossref.org/works/10.1063%2F1.356410

retrieved

21 January 2018

The Quartz Microbalance: A Novel Approach to the In-Situ Investigation of Interfacial Phenomena at the Solid/Liquid Junction[New Analytical Methods(40)]

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https://api.crossref.org/works/10.1063%2F1.356410

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21 January 2018

Investigation of film‐thickness determination by oscillating quartz resonators with large mass load

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https://api.crossref.org/works/10.1063%2F1.356410

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21 January 2018

Physical description of a viscoelastically loaded AT‐cut quartz resonator

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https://api.crossref.org/works/10.1063%2F1.356410

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21 January 2018

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10.1063/1.356410

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(Q56483264)

Characterization of a thickness‐shear mode quartz resonator with multiple nonpiezoelectric layers

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