(Q56806416)

English

Electronically Driven Structure Changes of Si Captured by Femtosecond Electron Diffraction

scientific article published in Physical Review Letters

Statements

Electronically Driven Structure Changes of Si Captured by Femtosecond Electron Diffraction (English)
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Christoph T. Hebeisen
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Germán Sciaini
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Weina Peng
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Thibault Dartigalongue
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Mark A. Eriksson
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Sergei G. Kruglik
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R. J. Dwayne Miller
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18 April 2008
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100
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15
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