(Q57099475)

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Femtosecond melting and ablation of semiconductors studied with time of flight mass spectroscopy

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Femtosecond melting and ablation of semiconductors studied with time of flight mass spectroscopy (English)

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1

Andrea Cavalleri

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author name string

Klaus Sokolowski-Tinten

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2

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Joerg Bialkowski

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3

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Michaela Schreiner

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4

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Dietrich von der Linde

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5

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publication date

15 March 1999

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published in

Journal of Applied Physics

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volume

85

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issue

6

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page(s)

3301-3309

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cites work

Time dependence of the laser-induced femtosecond lattice instability of Si and GaAs: Role of longitudinal optical distortions

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https://api.crossref.org/works/10.1063%2F1.369675

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21 January 2018

Ab initioMolecular Dynamics Simulation of Laser Melting of Silicon

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https://api.crossref.org/works/10.1063%2F1.369675

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21 January 2018

Simple technique for measurements of pulsed Gaussian-beam spot sizes

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reference URL

https://api.crossref.org/works/10.1063%2F1.369675

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21 January 2018

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DOI

10.1063/1.369675

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(Q57099475)

Femtosecond melting and ablation of semiconductors studied with time of flight mass spectroscopy

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