(Q57938744)

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Electron-beam-induced deformations of SiO2 nanostructures

article by A. J. Storm et al published July 2005 in Journal of Applied Physics

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Electron-beam-induced deformations of SiO2 nanostructures (English)

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C. Dekker

5

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A. J. Storm

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1

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J. H. Chen

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2

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X. S. Ling

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H. W. Zandbergen

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publication date

July 2005

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Journal of Applied Physics

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98

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1

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014307

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21 January 2018

Ion-beam sculpting at nanometre length scales

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Fabrication of solid-state nanopores with single-nanometre precision.

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21 January 2018

DNA molecules and configurations in a solid-state nanopore microscope

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21 January 2018

Translocation of double-strand DNA through a silicon oxide nanopore

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21 January 2018

Microscopic Kinetics of DNA Translocation through synthetic nanopores

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21 January 2018

Pushing the limits of lithography

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21 January 2018

Positioning single atoms with a scanning tunnelling microscope

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https://api.crossref.org/works/10.1063%2F1.1947391

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21 January 2018

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10.1063/1.1947391

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(Q57938744)

Electron-beam-induced deformations of SiO2 nanostructures

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