(Q58004139)

English

Characterization of Grain Boundaries in Cu(In,Ga)Se2Films Using Atom-Probe Tomography

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Characterization of Grain Boundaries in Cu(In,Ga)Se2Films Using Atom-Probe Tomography (English)
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Daniel Abou-Ras
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Sebastian S. Schmidt
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Raquel Caballero
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October 2011
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1
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207-212
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