(Q58012387)

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X-ray photoelectron spectroscopy of surface-treated indium-tin oxide thin films

scholarly article by J.S. Kim et al published December 1999 in Chemical Physics Letters

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X-ray photoelectron spectroscopy of surface-treated indium-tin oxide thin films (English)

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F. Cacialli

5

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J.S. Kim

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1

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P.K.H. Ho

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2

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D.S. Thomas

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3

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R.H. Friend

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G.-W. Bao

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6

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S.F.Y. Li

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7

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publication date

December 1999

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Chemical Physics Letters

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volume

315

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5-6

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page(s)

307-312

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Anomalous electrical characteristics, memory phenomena and microcavity effects in polymeric light-emitting diodes

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7 January 2021

Indium–tin oxide treatments for single- and double-layer polymeric light-emitting diodes: The relation between the anode physical, chemical, and morphological properties and the device performance

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7 January 2021

Improved operational stability of polyfluorene-based organic light-emitting diodes with plasma-treated indium–tin–oxide anodes

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7 January 2021

Surface energy and polarity of treated indium–tin–oxide anodes for polymer light-emitting diodes studied by contact-angle measurements

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7 January 2021

Increase of charge carriers density and reduction of Hall mobilities in oxygen-plasma treated indium–tin–oxide anodes

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7 January 2021

X‐ray photoemission spectroscopy studies of Sn‐doped indium‐oxide films

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https://api.crossref.org/works/10.1016%2FS0009-2614%2899%2901233-6

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7 January 2021

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10.1016/S0009-2614(99)01233-6

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(Q58012387)

X-ray photoelectron spectroscopy of surface-treated indium-tin oxide thin films

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