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Practical aspects of atomic resolution imaging and analysis in STEM
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title
Practical aspects of atomic resolution imaging and analysis in STEM
(English)
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author name string
E.M James
series ordinal
1
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N.D Browning
series ordinal
2
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publication date
June 1999
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published in
Ultramicroscopy
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volume
78
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issue
1-4
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page(s)
125-139
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cites work
Direct experimental determination of the atomic structure at internal interfaces
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https://api.crossref.org/works/10.1016%2FS0304-3991%2899%2900018-2
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7 January 2021
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Atomic-resolution chemical analysis using a scanning transmission electron microscope
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reference URL
https://api.crossref.org/works/10.1016%2FS0304-3991%2899%2900018-2
retrieved
7 January 2021
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Simultaneous STEM imaging and electron energy-loss spectroscopy with atomic-column sensitivity
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reference URL
https://api.crossref.org/works/10.1016%2FS0304-3991%2899%2900018-2
retrieved
7 January 2021
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Resolution beyond the 'information limit' in transmission electron microscopy
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https://api.crossref.org/works/10.1016%2FS0304-3991%2899%2900018-2
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7 January 2021
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Über einige Fehler von Elektronenlinsen
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https://api.crossref.org/works/10.1016%2FS0304-3991%2899%2900018-2
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7 January 2021
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Incoherent Imaging of Crystals Using Thermally Scattered Electrons
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https://api.crossref.org/works/10.1016%2FS0304-3991%2899%2900018-2
retrieved
7 January 2021
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Atomic-resolution electron energy loss spectroscopy in crystalline solids
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reference URL
https://api.crossref.org/works/10.1016%2FS0304-3991%2899%2900018-2
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7 January 2021
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Identifiers
DOI
10.1016/S0304-3991(99)00018-2
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