(Q58021956)

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EELS in the STEM: Determination of materials properties on the atomic scale

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EELS in the STEM: Determination of materials properties on the atomic scale (English)

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author name string

N.D Browning

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1

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D.J Wallis

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2

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P.D Nellist

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3

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S.J Pennycook

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4

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publication date

October 1997

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published in

Micron

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volume

28

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issue

5

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page(s)

333-348

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Absorptive potentials due to ionization and thermal diffuse scattering by fast electrons in crystals

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https://api.crossref.org/works/10.1016%2FS0968-4328%2897%2900033-4

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7 January 2021

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Simultaneous STEM imaging and electron energy-loss spectroscopy with atomic-column sensitivity

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https://api.crossref.org/works/10.1016%2FS0968-4328%2897%2900033-4

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Multiple-scattering regime and higher-order correlations in x-ray-absorption spectra of liquid solutions

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Atomic-resolution chemical analysis using a scanning transmission electron microscope

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Electron-energy-loss-spectroscopy near-edge fine structures in the iron-oxygen system

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Direct Determination of Grain Boundary Atomic Structure in SrTiO3

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Chemically sensitive structure-imaging with a scanning transmission electron microscope

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High-resolution incoherent imaging of crystals

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Atomic-resolution electron energy loss spectroscopy in crystalline solids

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7 January 2021

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High-order multiple-scattering calculations of x-ray-absorption fine structure

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7 January 2021

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DOI

10.1016/S0968-4328(97)00033-4

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(Q58021956)

EELS in the STEM: Determination of materials properties on the atomic scale

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