(Q58429569)
Statements
Measurement of the inclusive semielectronic D0 branching fraction (English)
Thorndike EH
Stroynowski R
Severini H
Kubota Y
Lattery M
Nelson JK
Patton S
Riehle T
Savinov V V
Wang R
Kim IJ
Ling Z
Mahmood AH
O'Neill JJ
Sun CR
Timm S
Wappler F
Crawford G
Duboscq JE
Fulton R
Fujino D
Gan KK
Honscheid K
Kagan H
Kass R
Lee J
Sung M
White C
Wolf A
Zoeller MM
Fu X
Nemati B
Ross WR
Wood M
Bishai M
Fast J
Gerndt E
Hinson JW
Miao T
Miller DH
Modesitt M
Shibata EI
Shipsey IP
Wang PN
Gibbons L
Johnson SD
Kwon Y
Roberts S
Coan TE
Dominick J
Fadeyev V V
Korolkov I I
Lambrecht M
Sanghera S
Shelkov V V
Volobouev I I
Wei G
Gao M
1 September 1996
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