(Q58435335)

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Exploring the potential of ellipsometry for the characterisation of electronic, optical, morphologic and thermodynamic properties of polyfluorene thin films

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Exploring the potential of ellipsometry for the characterisation of electronic, optical, morphologic and thermodynamic properties of polyfluorene thin films (English)

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Mariano Campoy-Quiles

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M. Campoy-Quiles

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1

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P.G. Etchegoin

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2

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D.D.C. Bradley

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3

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publication date

November 2005

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published in

Synthetic Metals

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volume

155

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issue

2

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page(s)

279-282

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DOI

10.1016/J.SYNTHMET.2005.01.031

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(Q58435335)

Exploring the potential of ellipsometry for the characterisation of electronic, optical, morphologic and thermodynamic properties of polyfluorene thin films

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