(Q58642584)

1

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M. Bammerlin

2

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O. Pfeiffer

4

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A. Abdurixit

5

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V. Barwich

6

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R. Bennewitz

7

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A. Baratoff

8

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E. Meyer

9

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H.-J. Güntherodt

Atomic resolution of the silicon (111)-(7x7) surface by atomic force microscopy.

10

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language of work or name

English

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publication date

15 April 2000

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published in

Physical Review B

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volume

61

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issue

16

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page(s)

11151-11155

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cites work

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVB.61.11151

Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVB.61.11151

Phase variation experiments in non-contact dynamic force microscopy using phase locked loop techniques

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVB.61.11151

Forces and frequency shifts in atomic-resolution dynamic-force microscopy

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVB.61.11151

Multifunctional probe microscope for facile operation in ultrahigh vacuum

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVB.61.11151

Comparison of dynamic lever STM and noncontact AFM

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVB.61.11151

Fast digital electronics for application in dynamic force microscopy using high-Q cantilevers

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVB.61.11151

Ultrathin films of NaCl on Cu(111): a LEED and dynamic force microscopy study

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVB.61.11151

Direct mechanical measurement of interatomic potentials

21 January 2018

1 reference

https://api.crossref.org/works/10.1103%2FPHYSREVB.61.11151