Wikidata

(Q58886069)

English

Capacitors with an Equivalent Oxide Thickness of <0.5 nm for Nanoscale Electronic Semiconductor Memory

article published in 2010

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title
Capacitors with an Equivalent Oxide Thickness of <0.5 nm for Nanoscale Electronic Semiconductor Memory (English)
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author
Seong Keun Kim
series ordinal
1
object named as
Seong Keun Kim
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Cheol Seong Hwang
series ordinal
6
object named as
Cheol Seong Hwang
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author name string
Sang Woon Lee
series ordinal
2
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Jeong Hwan Han
series ordinal
3
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Bora Lee
series ordinal
4
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Seungwu Han
series ordinal
5
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publication date
23 August 2010
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volume
20
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issue
18
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page(s)
2989-3003
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Identifiers

 
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