(Q59422873)

English

Stress and temperature dependence of subband structure in silicon inversion layers

scholarly article in Physical Review B, vol. 19 no. 12, June 1979

Statements

Stress and temperature dependence of subband structure in silicon inversion layers (English)
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R. K. Kalia
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M. Nakayama
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J. J. Quinn
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15 June 1979
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19
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12
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6397-6406
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