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Atomic force microscopy for the determination of refractive index profiles of optical fibers and waveguides: A quantitative study

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Atomic force microscopy for the determination of refractive index profiles of optical fibers and waveguides: A quantitative study (English)

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1 reference

A. Roberts

3

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author name string

S. T. Huntington

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1

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P. Mulvaney

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2

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K. A. Nugent

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4

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M. Bazylenko

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5

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publication date

15 September 1997

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published in

Journal of Applied Physics

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volume

82

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issue

6

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page(s)

2730-2734

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cites work

Optical fiber index profiles by the refracted-ray method (refracted near-field scanning)

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https://api.crossref.org/works/10.1063%2F1.366103

retrieved

21 January 2018

Optical fiber profiles using the refracted near-field technique: a comparison with other methods

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Crossref

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https://api.crossref.org/works/10.1063%2F1.366103

retrieved

21 January 2018

Improved propagation-mode near-field method for refractive-index profiling of optical waveguides

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Crossref

reference URL

https://api.crossref.org/works/10.1063%2F1.366103

retrieved

21 January 2018

Viewing refractive-index profiles and small-scale inhomogeneities in glass optical fibers: some techniques

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https://api.crossref.org/works/10.1063%2F1.366103

retrieved

21 January 2018

Field characterization of a D-shaped optical fiber using scanning near-field optical microscopy

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https://api.crossref.org/works/10.1063%2F1.366103

retrieved

21 January 2018

Measurement of an elliptical fiber mode field using near‐field microscopy

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https://api.crossref.org/works/10.1063%2F1.366103

retrieved

21 January 2018

Direct observation of the tip shape in scanning probe microscopy

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https://api.crossref.org/works/10.1063%2F1.366103

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21 January 2018

z calibration of the atomic force microscope by means of a pyramidal tip

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https://api.crossref.org/works/10.1063%2F1.366103

retrieved

21 January 2018

Nondestructive determination of refractive index profile of an optical fiber: backward light scattering method

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stated in

Crossref

reference URL

https://api.crossref.org/works/10.1063%2F1.366103

retrieved

21 January 2018

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DOI

10.1063/1.366103

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(Q59699684)

Atomic force microscopy for the determination of refractive index profiles of optical fibers and waveguides: A quantitative study

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