(Q59707562)

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Scanning transmission electron microscopy of gate stacks with HfO2 dielectrics and TiN electrodes

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Scanning transmission electron microscopy of gate stacks with HfO2 dielectrics and TiN electrodes (English)
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Melody P. Agustin
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Leonardo R. C. Fonseca
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Jacob C. Hooker
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19 September 2005
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87
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12
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121909
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