Wikidata

(Q61950450)

English

Quantitative analysis of strengthening mechanisms in thin Cu films: Effects of film thickness, grain size, and passivation

scientific article published in May 1998

In more languages

Statements

title
Quantitative analysis of strengthening mechanisms in thin Cu films: Effects of film thickness, grain size, and passivation (English)
0 references
author name string
R-M. Keller
series ordinal
1
0 references
S. P. Baker
series ordinal
2
0 references
publication date
May 1998
0 references
volume
13
0 references
issue
05
0 references
page(s)
1307-1317
0 references

Identifiers

DOI
10.1557/JMR.1998.0186
0 references
 
edit
    edit
      edit
        edit
          edit
            edit
              edit
                edit
                  edit
                    Retrieved from "https://www.wikidata.org/w/index.php?title=Q61950450&oldid=1309214252"