(Q62113398)

English

Height anomalies in tapping mode atomic force microscopy in air caused by adhesion

scientific article published in September 1997

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Height anomalies in tapping mode atomic force microscopy in air caused by adhesion (English)

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Niek F. Van Hulst

4

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S.John T. Van Noort

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1

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Kees O. Van der Werf

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2

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Bart G. De Grooth

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3

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Jan Greve

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5

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publication date

September 1997

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published in

Ultramicroscopy

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volume

69

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issue

2

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page(s)

117-127

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cites work

Vertical dimension of hydrated biological samples in tapping mode scanning force microscopy

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Determination of heat-shock transcription factor 2 stoichiometry at looped DNA complexes using scanning force microscopy.

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Imaging viscoelasticity by force modulation with the atomic force microscope

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Nanosubharmonics: The dynamics of small nonlinear contacts

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Compact stand‐alone atomic force microscope

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Substrate preparation for reliable imaging of DNA molecules with the scanning force microscope.

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Biological materials studied with dynamic force microscopy

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Generic behavior of grazing impact oscillators

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10.1016/S0304-3991(97)00037-5

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(Q62113398)

Height anomalies in tapping mode atomic force microscopy in air caused by adhesion

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