(Q62395090)

English

Scanning cathodoluminescence microscopy: A unique approach to atomic-scale characterization of heterointerfaces and imaging of semiconductor inhomogeneities

No description defined

In more languages

edit

Statements

instance of

scholarly article

0 references

title

Scanning cathodoluminescence microscopy: A unique approach to atomic-scale characterization of heterointerfaces and imaging of semiconductor inhomogeneities (English)

0 references

1 reference

J. Christen

1

0 references

publication date

July 1991

0 references

published in

Journal of vacuum science & technology. an official journal of the American Vacuum Society. B, Microelectronics processing and phenomena

0 references

volume

9

0 references

issue

4

0 references

page(s)

2358

0 references

Identifiers

DOI

10.1116/1.585704

0 references

(Q62395090)

Scanning cathodoluminescence microscopy: A unique approach to atomic-scale characterization of heterointerfaces and imaging of semiconductor inhomogeneities

Statements

Identifiers

Sitelinks

Wikipedia(0 entries)

Wikibooks(0 entries)

Wikinews(0 entries)

Wikiquote(0 entries)

Wikisource(0 entries)

Wikiversity(0 entries)

Wikivoyage(0 entries)

Wiktionary(0 entries)

Multilingual sites(0 entries)