(Q62401403)

https://www.ebi.ac.uk/europepmc/webservices/rest/search?query=EXT_ID:19421217%20AND%20SRC:MED&resulttype=core&format=json

27 January 2020

title

Dopant profiling and surface analysis of silicon nanowires using capacitance-voltage measurements (English)

1 reference

https://www.ebi.ac.uk/europepmc/webservices/rest/search?query=EXT_ID:19421217%20AND%20SRC:MED&resulttype=core&format=json

27 January 2020

main subject

bioengineering

0 references

condensed matter physics

0 references

1 reference

1

1 reference

https://www.ebi.ac.uk/europepmc/webservices/rest/search?query=EXT_ID:19421217%20AND%20SRC:MED&resulttype=core&format=json

27 January 2020

Junqiao Wu

4

1 reference

https://www.ebi.ac.uk/europepmc/webservices/rest/search?query=EXT_ID:19421217%20AND%20SRC:MED&resulttype=core&format=json

27 January 2020

Jeffrey Bokor

5

0 references

author name string

Yu-Chih Tseng

2

1 reference

https://www.ebi.ac.uk/europepmc/webservices/rest/search?query=EXT_ID:19421217%20AND%20SRC:MED&resulttype=core&format=json

27 January 2020

Peidong Yang

6

1 reference

https://www.ebi.ac.uk/europepmc/webservices/rest/search?query=EXT_ID:19421217%20AND%20SRC:MED&resulttype=core&format=json

27 January 2020

Devesh R Khanal

3

1 reference

https://www.ebi.ac.uk/europepmc/webservices/rest/search?query=EXT_ID:19421217%20AND%20SRC:MED&resulttype=core&format=json

27 January 2020

language of work or name

English

0 references

publication date

15 March 2009

1 reference

https://www.ebi.ac.uk/europepmc/webservices/rest/search?query=EXT_ID:19421217%20AND%20SRC:MED&resulttype=core&format=json

27 January 2020

published in

Nature Nanotechnology

1 reference

https://www.ebi.ac.uk/europepmc/webservices/rest/search?query=EXT_ID:19421217%20AND%20SRC:MED&resulttype=core&format=json

27 January 2020

volume

4

1 reference

https://www.ebi.ac.uk/europepmc/webservices/rest/search?query=EXT_ID:19421217%20AND%20SRC:MED&resulttype=core&format=json

27 January 2020

issue

5

1 reference

https://www.ebi.ac.uk/europepmc/webservices/rest/search?query=EXT_ID:19421217%20AND%20SRC:MED&resulttype=core&format=json

27 January 2020

page(s)

311-314

1 reference

https://www.ebi.ac.uk/europepmc/webservices/rest/search?query=EXT_ID:19421217%20AND%20SRC:MED&resulttype=core&format=json

Nanowire nanosensors for highly sensitive and selective detection of biological and chemical species

27 January 2020

cites work

1 reference

12 December 2020

Measuring the capacitance of individual semiconductor nanowires for carrier mobility assessment

1 reference

12 December 2020

Gate coupling and charge distribution in nanowire field effect transistors

1 reference

12 December 2020

Electrical characteristics and chemical stability of non-oxidized, methyl-terminated silicon nanowires.

1 reference

12 December 2020

Enhanced thermoelectric performance of rough silicon nanowires

1 reference

12 December 2020

Silicon nanowire radial p-n junction solar cells.

1 reference

12 December 2020

Structures and energetics of hydrogen-terminated silicon nanowire surfaces

1 reference

12 December 2020

Measurement of carrier mobility in silicon nanowires

1 reference

12 December 2020

Giant piezoresistance effect in silicon nanowires

1 reference

12 December 2020

Very High Frequency Silicon Nanowire Electromechanical Resonators

1 reference

https://api.crossref.org/works/10.1038%2FNNANO.2009.43

7 January 2021

Comparison of the device physics principles of planar and radial p-n junction nanorod solar cells

1 reference

https://api.crossref.org/works/10.1038%2FNNANO.2009.43

7 January 2021

InAs nanowire metal-oxide-semiconductor capacitors

1 reference

https://api.crossref.org/works/10.1038%2FNNANO.2009.43

7 January 2021

VAPOR‐LIQUID‐SOLID MECHANISM OF SINGLE CRYSTAL GROWTH

1 reference

https://api.crossref.org/works/10.1038%2FNNANO.2009.43

7 January 2021

High-κ gate dielectrics: Current status and materials properties considerations

1 reference

https://api.crossref.org/works/10.1038%2FNNANO.2009.43

7 January 2021

An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes

1 reference

https://api.crossref.org/works/10.1038%2FNNANO.2009.43

7 January 2021