(Q62678270)

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Controlled variation of the information depth by angle dependent soft X-ray emission spectroscopy: A study on polycrystalline Cu(In,Ga)Se2

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Controlled variation of the information depth by angle dependent soft X-ray emission spectroscopy: A study on polycrystalline Cu(In,Ga)Se2 (English)
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A. Grimm
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C. Camus
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C.A. Kaufmann
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Ch. Jung
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T. Kropp
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M.C. Lux-Steiner
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Ch.-H. Fischer
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December 2008
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255
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5
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2474-2477
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