Wikidata

(Q63407126)

English

High‐resolution capacitance measurement and potentiometry by force microscopy

article published in 1988

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Statements

title
High‐resolution capacitance measurement and potentiometry by force microscopy (English)
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main subject
microscopy
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author
Hemantha Wickramasinghe
series ordinal
3
object named as
H. Kumar Wickramasinghe
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author name string
Yves Martin
series ordinal
1
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David W. Abraham
series ordinal
2
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publication date
28 March 1988
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volume
52
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issue
13
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page(s)
1103-1105
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Identifiers

DOI
10.1063/1.99224
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