(Q63790171)

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Measurement of effective source distribution and its importance for quantitative interpretation of STEM images

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Measurement of effective source distribution and its importance for quantitative interpretation of STEM images (English)

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J. Etheridge

3

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C. Dwyer

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R. Erni

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2

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publication date

July 2010

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published in

Ultramicroscopy

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volume

110

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issue

8

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page(s)

952-957

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High-angle scattering of fast electrons from crystals containing heavy elements: Simulation and experiment

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7 January 2021

Atomic-Resolution Imaging with a Sub-50-pm Electron Probe

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Die Wahrscheinliche Schwingungsverteilung in Einer von Einer Lichtquelle Direkt Oder Mittels Einer Linse Beleuchteten Ebene

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7 January 2021

The concept of degree of coherence and its application to optical problems

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7 January 2021

Beyond the conventional information limit: the relevant coherence function

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7 January 2021

A method for measuring the effective source coherence in a field emission transmission electron microscope

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Measuring the PSF from aperture images of arbitrary shape--an algorithm

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Effects of thermal diffuse scattering and surface tilt on diffraction and channeling of fast electrons in CdTe

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Calculations of HREM image intensity using Monte Carlo integration.

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Scanning transmission electron microscopy of thin specimens

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High-resolution transmission electron microscopy on an absolute contrast scale

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Simulation of scanning transmission electron microscope images on desktop computers

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7 January 2021

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10.1016/J.ULTRAMIC.2010.01.007

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(Q63790171)

Measurement of effective source distribution and its importance for quantitative interpretation of STEM images

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