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Phantom Force Induced by Tunneling Current: A Characterization on Si(111)

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Phantom Force Induced by Tunneling Current: A Characterization on Si(111) (English)

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5

F. J. Giessibl

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A. J. Weymouth

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1

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T. Wutscher

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2

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J. Welker

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3

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T. Hofmann

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4

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language of work or name

English

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publication date

1 June 2011

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published in

Physical Review Letters

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PubMed

volume

106

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22

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cites work

7 × 7 Reconstruction on Si(111) Resolved in Real Space

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https://api.crossref.org/works/10.1103%2FPHYSREVLETT.106.226801

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21 January 2018

Atomic force microscope

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https://api.crossref.org/works/10.1103%2FPHYSREVLETT.106.226801

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21 January 2018

Subatomic Features on the Silicon (111)-(7x7) Surface Observed by Atomic Force Microscopy.

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https://api.crossref.org/works/10.1103%2FPHYSREVLETT.106.226801

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21 January 2018

The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy

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https://api.crossref.org/works/10.1103%2FPHYSREVLETT.106.226801

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21 January 2018

Force microscopy with light-atom probes

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https://api.crossref.org/works/10.1103%2FPHYSREVLETT.106.226801

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21 January 2018

Atomic resolution of the silicon (111)-(7x7) surface by atomic force microscopy.

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https://api.crossref.org/works/10.1103%2FPHYSREVLETT.106.226801

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21 January 2018

New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors.

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https://api.crossref.org/works/10.1103%2FPHYSREVLETT.106.226801

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21 January 2018

Contrast inversion in nc-AFM on Si(111)7×7 due to short-range electrostatic interactions

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reference URL

https://api.crossref.org/works/10.1103%2FPHYSREVLETT.106.226801

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21 January 2018

Separation of interactions by noncontact force microscopy

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reference URL

https://api.crossref.org/works/10.1103%2FPHYSREVLETT.106.226801

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21 January 2018

(Q27335778)

Phantom Force Induced by Tunneling Current: A Characterization on Si(111)

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