(Q33369643)

English

Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-A information limit

scientific article

Statements

Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-A information limit (English)
C Kisielowski
M van der Stam
S von Harrach
M Stekelenburg
S J Pennycook
I M Anderson
V Radmilovic

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