(Q51154302)

31 March 2018

title

Three-dimensional ADF imaging of individual atoms by through-focal series scanning transmission electron microscopy. (English)

1 reference

31 March 2018

Mark P Oxley

3

0 references

Andrew R Lupini

object named as

Andrew R Lupini

2

0 references

Klaus van Benthem

object named as

Klaus van Benthem

1

0 references

Scott D. Findlay

object named as

Scott D Findlay

4

0 references

author name string

Leslie J Allen

5

1 reference

31 March 2018

Stephen J Pennycook

6

1 reference

31 March 2018

publication date

5 July 2006

1 reference

31 March 2018

published in

Ultramicroscopy

1 reference

31 March 2018

volume

106

1 reference

31 March 2018

issue

11-12

1 reference

31 March 2018

page(s)

1062-1068

1 reference

31 March 2018

Dopants adsorbed as single atoms prevent degradation of catalysts.

cites work

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2006.04.020

Sub-ångstrom resolution using aberration corrected electron optics

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2006.04.020

Towards sub-0.5 A electron beams

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2006.04.020

Direct sub-angstrom imaging of a crystal lattice

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2006.04.020

Atomic-scale imaging of individual dopant atoms and clusters in highly n-type bulk Si

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2006.04.020

Localization in elastic and inelastic scattering

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2006.04.020

Spectroscopic Imaging of Single Atoms Within a Bulk Solid

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2006.04.020

Three-dimensional imaging of individual hafnium atoms inside a semiconductor device

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2006.04.020

Depth sectioning with the aberration-corrected scanning transmission electron microscope

7 January 2021

1 reference

https://api.crossref.org/works/10.1016%2FJ.ULTRAMIC.2006.04.020

10.1016/J.ULTRAMIC.2006.04.020

7 January 2021

Identifiers

DOI

1 reference

31 March 2018

1 reference

31 March 2018