(Q34480395)

2 August 2017

title

Performances of an 80-200 kV microscope employing a cold-FEG and an aberration-corrected objective lens (English)

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2 August 2017

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Jaysen Nelayah

2

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author name string

Christian Ricolleau

1

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2 August 2017

Tetsuo Oikawa

3

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2 August 2017

Yuji Kohno

4

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2 August 2017

Nadi Braidy

5

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2 August 2017

Guillaulle Wang

6

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2 August 2017

Florian Hue

7

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2 August 2017

Lenuta Florea

8

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2 August 2017

Véronique Pierron Bohnes

9

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2 August 2017

Damien Alloyeau

10

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2 August 2017

language of work or name

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16 November 2012

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2 August 2017

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2 August 2017

volume

62

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2 August 2017

issue

2

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2 August 2017

page(s)

283-293

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Towards sub-Å electron beams

2 August 2017

cites work

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https://api.crossref.org/works/10.1093%2FJMICRO%2FDFS072

0.23 eV energy resolution obtained using a cold field-emission gun and a streak imaging technique.

21 January 2018

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https://api.crossref.org/works/10.1093%2FJMICRO%2FDFS072

Studying atomic structures by aberration-corrected transmission electron microscopy

21 January 2018

1 reference

https://api.crossref.org/works/10.1093%2FJMICRO%2FDFS072

Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-A information limit

21 January 2018

1 reference

https://api.crossref.org/works/10.1093%2FJMICRO%2FDFS072

Direct imaging and chemical analysis of unstained DNA origami performed with a transmission electron microscope

21 January 2018

1 reference

https://api.crossref.org/works/10.1093%2FJMICRO%2FDFS072

Graphene at the edge: stability and dynamics

21 January 2018

1 reference

https://api.crossref.org/works/10.1093%2FJMICRO%2FDFS072

Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy

21 January 2018

1 reference

https://api.crossref.org/works/10.1093%2FJMICRO%2FDFS072

Flash laser annealing for controlling size and shape of magnetic alloy nanoparticles

21 January 2018

1 reference

https://api.crossref.org/works/10.1093%2FJMICRO%2FDFS072

Coma-free alignment of high resolution electron microscopes with the aid of optical diffractograms

21 January 2018

1 reference

https://api.crossref.org/works/10.1093%2FJMICRO%2FDFS072

Transmission electron microscopy at 20 kV for imaging and spectroscopy

21 January 2018

1 reference

https://api.crossref.org/works/10.1093%2FJMICRO%2FDFS072

STEM nanodiffraction technique for structural analysis of CoPt nanoparticles.

21 January 2018

1 reference

https://api.crossref.org/works/10.1093%2FJMICRO%2FDFS072

Size and shape effects on the order-disorder phase transition in CoPt nanoparticles

21 January 2018

1 reference

https://api.crossref.org/works/10.1093%2FJMICRO%2FDFS072

Comparing electron tomography and HRTEM slicing methods as tools to measure the thickness of nanoparticles

21 January 2018

1 reference

https://api.crossref.org/works/10.1093%2FJMICRO%2FDFS072

Monochromators and Aberration Correctors: Taking EELS to New Levels of Energy and Spatial Resolution

21 January 2018

1 reference

https://api.crossref.org/works/10.1093%2FJMICRO%2FDFS072

Electron microscopy image enhanced

21 January 2018

1 reference

https://api.crossref.org/works/10.1093%2FJMICRO%2FDFS072

21 January 2018

Identifiers

DOI

10.1093/JMICRO/DFS072

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2 August 2017

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