(Q43901151)

27 November 2017

title

The influence of the sample thickness on the lateral and axial resolution of aberration-corrected scanning transmission electron microscopy (English)

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27 November 2017

2

Hendrix Demers

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27 November 2017

3

Niels de Jonge

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27 November 2017

Ranjan Ramachandra

1

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27 November 2017

publication date

7 January 2013

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Microscopy and Microanalysis

27 November 2017

published in

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27 November 2017

volume

19

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27 November 2017

issue

1

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27 November 2017

page(s)

93-101

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The three-dimensional point spread function of aberration-corrected scanning transmission electron microscopy

27 November 2017

cites work

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Nanoscale 3D cellular imaging by axial scanning transmission electron tomography

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Upper limits for the residual aberrations of a high-resolution aberration-corrected STEM

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Radiation damage in the TEM and SEM.

21 January 2018

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Three-dimensional locations of gold-labeled proteins in a whole mount eukaryotic cell obtained with 3nm precision using aberration-corrected scanning transmission electron microscopy

21 January 2018

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Simulating STEM imaging of nanoparticles in micrometers-thick substrates

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Nanometer-resolution electron microscopy through micrometers-thick water layers

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Atmospheric pressure scanning transmission electron microscopy

21 January 2018

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Depth sectioning with the aberration-corrected scanning transmission electron microscope

21 January 2018

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The formation and utility of sub-angstrom to nanometer-sized electron probes in the aberration-corrected transmission electron microscope at the University of Illinois.

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Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope.

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Image quality of microns-thick specimens in the ultra-high voltage electron microscope

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Three-dimensional imaging of individual hafnium atoms inside a semiconductor device

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7 January 2021

Optimized deconvolution for maximum axial resolution in three-dimensional aberration-corrected scanning transmission electron microscopy

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7 January 2021

Atomic-resolution scanning transmission electron microscopy through 50-nm-thick silicon nitride membranes

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7 January 2021

The probe profile and lateral resolution of scanning transmission electron microscopy of thick specimens

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7 January 2021

Three-dimensional scanning transmission electron microscopy of biological specimens

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7 January 2021

Direct sub-angstrom imaging of a crystal lattice

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7 January 2021

Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part II: Inelastic scattering

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7 January 2021

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7 January 2021

Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in S/TEM

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7 January 2021

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Identifiers

DOI

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27 November 2017

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