(Q56866313)

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Electron backscatter diffraction: Strategies for reliable data acquisition and processing

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Automatic Recognition of Deformed and Recrystallized Regions in Partly Recrystallized Samples Using Electron Back Scattering Patterns

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Phase Identification in a Scanning Electron Microscope Using Backscattered Electron Kikuchi Patterns

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Quantitative deformation studies using electron back scatter patterns

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Crystallographic aspects of geometrically-necessary and statistically-stored dislocation density

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

The effect of crystal orientation on the indentation response of commercially pure titanium: experiments and simulations

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Measurement of elastic strains and small lattice rotations using electron back scatter diffraction.

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Advances in SEM-based diffraction studies of defects and strains in semiconductors

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

A new method for determining small misorientations from electron back scatter diffraction patterns

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Bragg's Law diffraction simulations for electron backscatter diffraction analysis

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Measurement and mapping of small changes of crystal orientation by electron backscattering diffraction

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Accuracy assessment of elastic strain measurement by EBSD.

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

High resolution surface morphology measurements using EBSD cross-correlation techniques and AFM.

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations.

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Comments on the paper "Bragg's law diffraction simulations for electron backscatter diffraction analysis" by Josh Kacher, Colin Landon, Brent L. Adams & David Fullwood

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

A 3D Hough transform for indexing EBSD and Kossel patterns

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Mapping strains at the nanoscale using electron back scatter diffraction

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Analysis of local chemical and structural inhomogeneities in FeySe1−xTex single crystals

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Characterisation of plastic zones around crack-tips in pure single-crystal tungsten using electron backscatter diffraction

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

High-resolution electron backscatter diffraction: An emerging tool for studying local deformation

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Elastic strain tensor measurement using electron backscatter diffraction in the SEM

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Geometrically necessary dislocation density distributions in Ti–6Al–4V deformed in tension

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Electron backscatter diffraction study of dislocation content of a macrozone in hot-rolled Ti–6Al–4V alloy

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Micromechanical and macromechanical effects in grain scale polycrystal plasticity experimentation and simulation

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Combined EBSD/EDS tomography in a dual-beam FIB/FEG-SEM.

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Three-Dimensional Orientation Microscopy in a Focused Ion Beam–Scanning Electron Microscope: A New Dimension of Microstructure Characterization

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Image distortions in SEM and their influences on EBSD measurements.

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Three-dimensional orientation mapping in the transmission electron microscope

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Formation and subdivision of deformation structures during plastic deformation

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Forward modeling method for microstructure reconstruction using x-ray diffraction microscopy: Single-crystal verification

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Dynamical effects of anisotropic inelastic scattering in electron backscatter diffraction

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Principles of depth-resolved Kikuchi pattern simulation for electron backscatter diffraction

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Many-beam dynamical simulation of electron backscatter diffraction patterns

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021

Site-specific recoil diffraction of backscattered electrons in crystals

1 reference

https://api.crossref.org/works/10.1016%2FS1369-7021%2812%2970163-3

7 January 2021