(Q57656431)

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Infrared nanoscopy of strained semiconductors

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scholarly article

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Infrared nanoscopy of strained semiconductors (English)

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Rainer Hillenbrand

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R. Hillenbrand

4

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author name string

A. J. Huber

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A. Ziegler

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T. Köck

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publication date

11 January 2009

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Nature Nanotechnology

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4

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3

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153-157

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https://scigraph.springernature.com/pub.10.1038/nnano.2008.399

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Anisotropy contrast in phonon-enhanced apertureless near-field microscopy using a free-electron laser

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https://pubmed.ncbi.nlm.nih.gov/19265843

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Phonon-enhanced light matter interaction at the nanometre scale.

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https://pubmed.ncbi.nlm.nih.gov/19265843

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High-Resolution Near-Field Raman Microscopy of Single-Walled Carbon Nanotubes

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https://pubmed.ncbi.nlm.nih.gov/19265843

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Pressure-dependent properties of SiC polytypes

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https://pubmed.ncbi.nlm.nih.gov/19265843

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Technology and metrology of new electronic materials and devices

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https://pubmed.ncbi.nlm.nih.gov/19265843

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Raman modes of 6H polytype of silicon carbide to ultrahigh pressures: A comparison with silicon and diamond

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https://pubmed.ncbi.nlm.nih.gov/19265843

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Subwavelength-scale tailoring of surface phonon polaritons by focused ion-beam implantation

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https://pubmed.ncbi.nlm.nih.gov/19265843

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Analytical model for quantitative prediction of material contrasts in scattering-type near-field optical microscopy

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https://pubmed.ncbi.nlm.nih.gov/19265843

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Terahertz near-field nanoscopy of mobile carriers in single semiconductor nanodevices

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https://pubmed.ncbi.nlm.nih.gov/19265843

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Silicon device scaling to the sub-10-nm regime.

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https://pubmed.ncbi.nlm.nih.gov/19265843

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Nanoscale holographic interferometry for strain measurements in electronic devices

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https://pubmed.ncbi.nlm.nih.gov/19265843

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Nanoscale Resolved Infrared Probing of Crystal Structure and of Plasmon−Phonon Coupling

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Nanoscale uniaxial pressure effect of a carbon nanotube bundle on tip-enhanced near-field Raman spectra

1 reference

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The development of grain-orientation-dependent residual stressess in a cyclically deformed alloy

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https://pubmed.ncbi.nlm.nih.gov/19265843

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Spectroscopic near-field microscopy using frequency combs in the mid-infrared

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https://pubmed.ncbi.nlm.nih.gov/19265843

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Silicon‐silicon dioxide interface: An infrared study

1 reference

https://api.crossref.org/works/10.1038%2FNNANO.2008.399

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Principles of Nano-Optics

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Pseudoheterodyne detection for background-free near-field spectroscopy

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Simultaneous IR Material Recognition and Conductivity Mapping by Nanoscale Near-Field Microscopy

1 reference

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Nanoscale chemical analysis by tip-enhanced Raman spectroscopy

1 reference

https://api.crossref.org/works/10.1038%2FNNANO.2008.399

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Near-field imaging of mid-infrared surface phonon polariton propagation

1 reference

https://api.crossref.org/works/10.1038%2FNNANO.2008.399

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Identifiers

10.1038/NNANO.2008.399

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