(Q58642568)

1

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M. Bammerlin

2

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A. Baratoff

3

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R. Lüthi

4

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Ch. Loppacher

5

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F.M. Battiston

6

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J. Lü

7

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R. Bennewitz

8

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E. Meyer

9

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H.-J. Güntherodt

10

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publication date

August 2000

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published in

Surface Science

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volume

461

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issue

1-3

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page(s)

255-265

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cites work

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True atomic resolution by atomic force microscopy through repulsive and attractive forces

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Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7

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Site-dependent electronic effects, forces, and deformations in scanning tunneling microscopy of flat metal surfaces

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Inequivalent atoms and imaging mechanisms in ac-mode atomic-force microscopy of Si(111)7 x 7

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ULTRAHIGH VACUUM ATOMIC FORCE MICROSCOPY: TRUE ATOMIC RESOLUTION

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Comparison of dynamic lever STM and noncontact AFM

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Low temperature scanning force microscopy of the Si(111)-(7x7) surface

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Structural analysis of Si(111)‐7×7 by UHV‐transmission electron diffraction and microscopy

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7 × 7 Reconstruction on Si(111) Resolved in Real Space

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Origin of surface states on Si(111)(7 x 7)

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Electrostatic sample-tip interactions in the scanning tunneling microscope

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Multifunctional probe microscope for facile operation in ultrahigh vacuum

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Aspects of dynamic force microscopy on NaCl/Cu(111): resolution, tip-sample interactions and cantilever oscillation characteristics

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Forces and frequency shifts in atomic-resolution dynamic-force microscopy

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Physical interpretation of frequency-modulation atomic force microscopy

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Dynamic SFM with true atomic resolution on alkali halide surfaces

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Fabry-Pérot transmission resonances in tunneling microscopy

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