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AFM's path to atomic resolution
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instance of
scholarly article
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title
AFM's path to atomic resolution
(English)
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author
Franz Josef Giessibl
series ordinal
1
object named as
Franz J. Giessibl
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publication date
May 2005
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published in
Materials Today
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volume
8
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issue
5
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page(s)
32-41
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cites work
Atomic force microscope
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Surface Studies by Scanning Tunneling Microscopy
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https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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7 × 7 Reconstruction on Si(111) Resolved in Real Space
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https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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Structural analysis of Si(111)‐7×7 by UHV‐transmission electron diffraction and microscopy
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https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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Atomic resolution on LiF (001) by atomic force microscopy
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reference URL
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Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuum
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True atomic resolution by atomic force microscopy through repulsive and attractive forces
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reference URL
https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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Atomic-force microscopy on the Si(111)7×7 surface
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https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
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https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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Forces and frequency shifts in atomic-resolution dynamic-force microscopy
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https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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Atomic resolution of the silicon (111)-(7x7) surface by atomic force microscopy.
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https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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Atomic Force Microscopy in Ultrahigh Vacuum
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Computer simulation of local order in condensed phases of silicon
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Advances in atomic force microscopy
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Physical interpretation of frequency-modulation atomic force microscopy
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Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy
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Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the qPlus sensor
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https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork
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https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork
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https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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Inequivalent atoms and imaging mechanisms in ac-mode atomic-force microscopy of Si(111)7 x 7
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https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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Direct measurement of interatomic force gradients using an ultra-low-amplitude atomic force microscope
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https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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Energy dissipation in atomic force microscopy and atomic loss processes
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reference URL
https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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7 January 2021
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Subatomic Features on the Silicon (111)-(7x7) Surface Observed by Atomic Force Microscopy.
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Seeing the atomic orbital: first-principles study of the effect of tip termination on atomic force microscopy
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Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations
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Probing the shape of atoms in real space
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Revealing the hidden atom in graphite by low-temperature atomic force microscopy
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Local spectroscopy and atomic imaging of tunneling current, forces, and dissipation on graphite.
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Atom-selective imaging of the GaAs(110) surface
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https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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7 January 2021
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Observation of electronic states on Si(111)-(7 x 7) through short-range attractive force with noncontact atomic force spectroscopy
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Atomic-scale friction of a tungsten tip on a graphite surface
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Single spin detection by magnetic resonance force microscopy
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https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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Force microscopy with light-atom probes
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https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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Theory and Application for the Scanning Tunneling Microscope
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Tip-sample interaction effects in scanning-tunneling and atomic-force microscopy
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https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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7 January 2021
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Low temperature scanning force microscopy of the Si(111)-(7x7) surface
1 reference
stated in
Crossref
reference URL
https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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7 January 2021
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High resolution atomic force microscopic imaging of the Si(111)-(7 x 7) surface: contribution of short-range force to the images
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Imaging of all dangling bonds and their potential on the Ge/Si105 surface by noncontact atomic force microscopy
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https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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Positioning single atoms with a scanning tunnelling microscope
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https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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Atom inlays performed at room temperature using atomic force microscopy
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Scanning probe microscopy. Probing the future
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Scanning Probe Evolution in Biology
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https://api.crossref.org/works/10.1016%2FS1369-7021%2805%2900844-8
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Identifiers
DOI
10.1016/S1369-7021(05)00844-8
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arXiv ID
cond-mat/0503671
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