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Fluorescence microscopy for quality control in nanoimprint lithography
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scholarly article
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title
Fluorescence microscopy for quality control in nanoimprint lithography
(English)
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main subject
quality control
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author
Lars Montelius
object named as
L. Montelius
series ordinal
11
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author name string
Ch. Finder
series ordinal
1
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M. Beck
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2
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J. Seekamp
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3
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K. Pfeiffer
series ordinal
4
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P. Carlberg
series ordinal
5
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I. Maximov
series ordinal
6
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F. Reuther
series ordinal
7
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E.-L. Sarwe
series ordinal
8
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S. Zankovich
series ordinal
9
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J. Ahopelto
series ordinal
10
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C. Mayer
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12
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C.M. Sotomayor Torres
series ordinal
13
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publication date
June 2003
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published in
Microelectronic Engineering
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volume
67-68
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page(s)
623-628
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cites work
Nanoimprint lithography
1 reference
stated in
Crossref
reference URL
https://api.crossref.org/works/10.1016%2FS0167-9317%2803%2900123-0
retrieved
7 January 2021
based on heuristic
inferred from DOI database lookup
Nanoimprint lithography at the 6 in. wafer scale
1 reference
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Crossref
reference URL
https://api.crossref.org/works/10.1016%2FS0167-9317%2803%2900123-0
retrieved
7 January 2021
based on heuristic
inferred from DOI database lookup
Polymer stamps for nanoimprinting
1 reference
stated in
Crossref
reference URL
https://api.crossref.org/works/10.1016%2FS0167-9317%2803%2900123-0
retrieved
7 January 2021
based on heuristic
inferred from DOI database lookup
Improving stamps for 10 nm level wafer scale nanoimprint lithography
1 reference
stated in
Crossref
reference URL
https://api.crossref.org/works/10.1016%2FS0167-9317%2803%2900123-0
retrieved
7 January 2021
based on heuristic
inferred from DOI database lookup
Identifiers
DOI
10.1016/S0167-9317(03)00123-0
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