(Q36594025)

15 August 2017

Temperature Effects of Sputtering of Langmuir-Blodgett Multilayers (English)

1 reference

15 August 2017

Nicholas Winograd

5

0 references

author name string

Dan Mao

1

1 reference

15 August 2017

Daniel A Brenes

2

1 reference

15 August 2017

Caiyan Lu

3

1 reference

15 August 2017

Andreas Wucher

4

1 reference

15 August 2017

6 July 2012

1 reference

Surface and Interface Analysis

15 August 2017

1 reference

15 August 2017

45

1 reference

15 August 2017

1

1 reference

15 August 2017

65-67

1 reference

Molecular depth profiling by wedged crater beveling.

15 August 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3566793

Three-dimensional mass spectral imaging of HeLa-M cells--sample preparation, data interpretation and visualisation

9 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3566793

Molecular depth profiling of buried lipid bilayers using C(60)-secondary ion mass spectrometry

9 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3566793

Molecular depth profiling with cluster secondary ion mass spectrometry and wedges

9 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3566793

Three-dimensional depth profiling of molecular structures.

9 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3566793

Depth resolution during C60+ profiling of multilayer molecular films

9 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3566793

Energy deposition during molecular depth profiling experiments with cluster ion beams

9 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3566793

Chemically alternating Langmuir-Blodgett thin films as a model for molecular depth profiling by mass spectrometry

9 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3566793

Performance characteristics of a chemical imaging time-of-flight mass spectrometer

9 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3566793

Bioimaging TOF-SIMS: High resolution 3D imaging of single cells.

9 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3566793

Sample cooling or rotation improves C60 organic depth profiles of multilayered reference samples: results from a VAMAS interlaboratory study.

30 September 2017

1 reference

https://eutils.ncbi.nlm.nih.gov/entrez/eutils/elink.fcgi?dbfrom=pmc&linkname=pmc_refs_pubmed&retmode=json&id=3566793

Depth profiling of 4-acetamindophenol-doped poly(lactic acid) films using cluster secondary ion mass spectrometry

28 June 2018

1 reference

Depth profiling of peptide films with TOF-SIMS and a C60 probe

21 January 2018

1 reference

Molecular depth profiling of multilayer polymer films using time-of-flight secondary ion mass spectrometry

21 January 2018

1 reference

Effects of Cryogenic Sample Analysis on Molecular Depth Profiles with TOF-Secondary Ion Mass Spectrometry

21 January 2018

1 reference

Preliminary evaluation of an SF5+ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry

21 January 2018

1 reference

PubMed

https://pubmed.ncbi.nlm.nih.gov/23397359

inferred from PubMed ID database lookup

12 December 2020

based on heuristic

Identifiers

DOI

10.1002/SIA.5082

1 reference

15 August 2017

1 reference

15 August 2017

PubMed publication ID

23397359

1 reference