(Q56561034)

Sergio Lozano-Perez

7

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Emmanuelle A. Marquis

Emmanuelle A. Marquis

8

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Rachel Angharad Oliver

9

Rachel A. Oliver

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Colin Humphreys

4

Colin J. Humphreys

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Peter M. Clifton

2

Peter H. Clifton

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Mark J. Galtrey

3

Mark J. Galtrey

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Alfred Cerezo

1

Alfred Cerezo

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author name string

Thomas F. Kelly

5

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David J. Larson

6

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Keith Thompson

11

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Mathijs Zandbergen

12

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Roger L. Alvis

Strategies for fabricating atom probe specimens with a dual beam FIB

13

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publication date

December 2007

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published in

Materials Today

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volume

10

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issue

12

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page(s)

36-42

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cites work

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Design of a femtosecond laser assisted tomographic atom probe

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Instrumentation Developments in Atom Probe Tomography: Applications in Semiconductor Research

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The Atom‐Probe Field Ion Microscope

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First data from a commercial local electrode atom probe (LEAP).

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A procedure for quantification of precipitate microstructures from three-dimensional atom probe data

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7 January 2021

The effect of Cu additions on the precipitation kinetics in an Al-Mg-Si alloy with excess Si

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7 January 2021

Evidence of field evaporation assisted by nonlinear optical rectification induced by ultrafast laser

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Field-ion specimen preparation using focused ion-beam milling

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7 January 2021

In situ site-specific specimen preparation for atom probe tomography

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Development of atom probe specimen preparation techniques for specific regions in steel materials

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Site-specific specimen preparation for atom probe tomography of grain boundaries

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7 January 2021

Atom probe specimen preparation with a dual beam SEM/FIB miller

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7 January 2021

Review of atom probe FIB-based specimen preparation methods

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7 January 2021

Imaging of arsenic Cottrell atmospheres around silicon defects by three-dimensional atom probe tomography

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High-resolution imaging of complex crack chemistry in reactor steels by NanoSIMS

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7 January 2021

Optical and microstructural studies of InGaN∕GaN single-quantum-well structures

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7 January 2021

Composition fluctuation in InGaN quantum wells made from molecular beam or metalorganic vapor phase epitaxial layers

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7 January 2021

The impact of electron beam damage on the detection of indium-rich localisation centres in InGaN quantum wells using transmission electron microscopy

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7 January 2021

Three-dimensional atom probe studies of an InxGa1−xN∕GaN multiple quantum well structure: Assessment of possible indium clustering

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